In semiconductor manufacturing, where every micron matters and testing accuracy directly impacts yield, high-performance spring probes (also known as contact probes or pogo pins) play a mission-critical role. Whether you’re dealing with wafer-level testing or advanced IC packaging, choosing the right spring probe can significantly enhance signal integrity, reduce test time, and improve long-term reliability.
At Sumitron, we offer a comprehensive range of spring probes designed for semiconductor testing, tailored to meet the evolving needs of OEMs, test engineers, and equipment manufacturers.
What Are Spring Probes and Why Are They Essential in Semiconductor Testing?
In ATE systems, spring probes provide precise electrical contact with semiconductor devices, ensuring accurate testing and validation. Unlike rigid test setups that can stress delicate components, spring probes offer controlled contact force and adaptive alignment, minimizing damage while ensuring precise and reliable electrical contact during testing.
Used extensively in high-volume production testing of wafers, PCBs, chip-scale packages, and more, spring probes help streamline operations and deliver critical data for yield analysis, failure diagnostics, and performance validation.
Explore the Types of Spring Probes Available for Semiconductor Testing
Sumitron offers a wide range of spring probes, manufactured under the trusted “MARATHON” series by KITA, to address specific testing requirements across different semiconductor applications:
1. Fine Pitch Spring Probes
Engineered for ultra-miniaturized semiconductor devices, fine pitch probes come with outer diameters starting as small as 0.11 mm. Ideal for high-density test environments, these probes ensure reliable contact even in extremely compact layouts.
2. High Current / High Temperature Probes
These are designed to withstand elevated temperatures (up to 200°C) and carry high currents without degrading in performance. Perfect for power devices, automotive-grade ICs, and thermal cycling tests.
3. High-Frequency Probes
Our high-frequency probes, available in 0.5 mm and 0.8 mm pitches, are designed to reduce signal degradation and support reliable testing. Their shortened total length (as little as 1.5 mm) ensures low insertion loss, making them suitable for RF testing and high-speed digital signal verification.
4. Kelvin Contact Probes
Kelvin probes provide separate paths for current supply and voltage measurement, ensuring accurate low-resistance measurements. These probes are crucial for the precise testing of low-voltage and resistive semiconductor components, where accurate measurements are paramount. Available in 0.3, 0.4, and 0.5 mm pitch.
5. Non-Magnetic Spring Probes
Constructed by using non-magnetic materials, these probes are ideal for testing environments sensitive to magnetic interference, such as magnetic sensors or MEMS devices. They eliminate magnetic noise that could distort test results.
6. Standard Pitch Probes with Enhanced Coatings
Gold-plated and coated with KITA’s innovative anti-solder migration technology, our standard pitch spring probes deliver enhanced performance. The anti-migration treatment extends probe life and prevents contamination during high-cycle testing.
Key Features That Set Sumitron’s Spring Probes Apart
- Wide pitch compatibility: From 0.15 mm to 1 mm, accommodating everything from advanced ICs to standard chipsets.
- Versatile tip designs: Multiple tip styles to suit varying DUT (Device Under Test) surfaces and contact conditions.
- Customizable configurations: Available in various travel lengths, spring forces, and materials to match exact test needs.
- Consistent electrical performance: Engineered to maintain low and stable contact resistance across millions of test cycles, ensuring long-term reliability and measurement accuracy.
- Short lead times: Particularly for the MARATHON series, which supports quick turnaround on small lot orders.
Industries That Benefit from High-Performance Spring Probes
Spring probes are integral to a range of industries, including:
- Semiconductor and Electronics Manufacturing: For ATE and final product validation
- Automotive Electronics: For testing power ICs, ECUs, and sensors
- Telecommunication Devices: For RF components and high-speed interface validation
- Medical Devices: For testing sensitive microelectronics and sensor modules
- Aerospace and Defense: For mission-critical chip testing in high-stress conditions
Why Choose Spring Probes from Sumitron?
Sumitron collaborates with renowned global suppliers to deliver cutting-edge test interface solutions to India’s manufacturing sector. Our spring probes are engineered to meet international standards while allowing for localized support and customization.
Whether you’re upgrading an existing test setup or designing a new one from scratch, Sumitron ensures you get:
- Access to KITA’s MARATHON series probes
- Expert consultation for probe selection
- Fast delivery and support
Get a Quote or Custom Spring Probe Solution
Precision matters. So does reliability. Get in touch with Sumitron to explore our full range of semiconductor spring probes. Whether you need fine pitch, Kelvin contact, or high-current probes, we’ll help you choose the perfect solution for your test requirements.
Contact Us Today for a Custom Quote.
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